Description
Measuring principle
|
Stylus method
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Probe
|
BFW skidless system
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Measuring range mm
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+/- 250 µm (up to +/- 750 µm with 3x probe arm length)
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Profile resolution
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Measuring range +/- 250 µm: 8 nm
Measuring range +/- 25 µm: 0.8 nm |
Filter according to ISO/JIS
|
Gaussian filter as per ISO 11562
Filter as per ISO 13565 |
Number n of sampling length according to ISO/JIS
|
1-5
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Contacting speeds
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0,2 mm/s; 1,0 mm/s
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Measuring force (N)
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0.75 mN
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Weight drive unit
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approx. 0.9 kg
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Weight measuring instrument
|
approx. 1.0 kg
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Surface parameters
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Over 50 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
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