MarSurf XC 2 Contour Measurement System

Your entry into precision contour measurement

The quick, simple and inexpensive 2D contour measuring system satisfies all demands in terms of accuracy and range of evaluation criteria
Consistently delivers safe and reliable results

Pparameters that are dependent on datum elements are recalculated as soon as a datum element is changed
Password protected user access prevents improper use
Outstanding calibration processes including geometry calibration, measuring force calibration, bend compensation, etc.
Sturdy, rigid probes
Smooth running, sturdy and accurate drive unit
Automatic lowering and raising of the probe arm at individually adjustable speeds
Patented probe arm attachement for collision protection

Description

Resolution	In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm) In Z, relative to measuring system: 0.04 µm
Sampling angle	On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
Start of traversing length (in X)	0.2 mm
Tip radius	25 µm
Contacting speed (in Z)	0.1 to 1 mm/s
Probe arm length	175 mm, 350 mm
End of traversing length (in X)	120 mm
Positioning speed	In X and return speed: 0.2 to 8 mm/s In Z: 0.2 to 10 mm/s
Guide deviation	< 1 µm (over 120 mm)
Measuring speed	0.2 mm/s to 4 mm/s
Measuring range mm	(in Z) 50 mm
Traversing lengths	0.2 mm to 120 mm
Measuring force (N)	1 mN to 120 mN

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